Approche de test de circuit analogique par la technique BIST

Abstract

In the digital world, the test techniques led to an eminent jump regarding to the test process quality which is characterized by simplicity, efficiency and speed. Among these techniques we quote the famous BIST that has been even implemented with the circuit to be tested so making it self-tested. On the contrary, the test in analog world is more complex due to its nature and more diversified with its test parameters. Unfortunately this task is delicate and time consumer. A very major concern that dominates in mind the researchers is to solve these problems. The objective fixed in our work is to test an Analog circuit by the technique BIST. The importance given here at the first stage is to pass this circuit test successfully while protecting its basic structure which uses the generation of test vectors. Then the signature analysis and decision-making have to be settled down on the presence and the absence of faults. The circuit under test is one of common use namely the inverter amplifier designed with a 741 type operational amplifier. In this study, the type of faults taken into account are catastrophic ones resulting from frequent physical damages to the CMOS and bipolar transistors. Our circuit subjected to the presence of this kind of failure is simulated by means of the SIMULINK to establish an analysis data collection from the faulty circuit responses.