Etude des propriétés des couches minces d’oxyde de cuivre

Abstract

In this work we have elaborated thin layers of CuO by Sol-Gel way realized during this study. The structural characterization of the thin layers obtained was done by X-ray diffraction (XRD), the morphological characterization was made by scanning electron microscopy (SEM) and the optical characterization was made by UV-Visible. The XRD made it possible to confirm the crystalline state of our thin layers as well as the formation of the CuO phase. The characterization by SEM showed the surface condition of the elaborated layers. Finally, the UVVisible allowed us to measure the transmission of thin layers based on CuO